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Lynx-2048 (GigE or CL)

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Product Description

The unique high line resolution achieved by the Lynx-2048 will maximize your production yields. This SWIR solution is perfectly suited for spectroscopy, and for non-destructive and detail-rich imaging from deeper layers of semiconductor materials or measuring the thickness and uniformity of its functional layers.

DATA SHEET (GigE)

DATA SHEET (CL)

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